From 754e71e850cb09d53543846fbed74cc5a1491c76 Mon Sep 17 00:00:00 2001 From: Przemyslaw Marczak Date: Wed, 15 Apr 2015 13:07:19 +0200 Subject: dm: test: Add tests for device's uclass platform data This test introduces new test structure type:dm_test_perdev_uc_pdata. The structure consists of three int values only. For the test purposes, three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1. This commit adds two test cases for uclass platform data: - Test: dm_test_autobind_uclass_pdata_alloc - this tests if: * uclass driver sets: .per_device_platdata_auto_alloc_size field * the devices's: dev->uclass_platdata is non-NULL - Test: dm_test_autobind_uclass_pdata_valid - this tests: * if the devices's: dev->uclass_platdata is non-NULL * the structure of type 'dm_test_perdev_uc_pdata' allocated at address pointed by dev->uclass_platdata. Each structure field, should be equal to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1. Signed-off-by: Przemyslaw Marczak Cc: Simon Glass Acked-by: Simon Glass --- include/dm/test.h | 20 ++++++++++++++++++++ 1 file changed, 20 insertions(+) (limited to 'include/dm/test.h') diff --git a/include/dm/test.h b/include/dm/test.h index 9c4b8d3e57..f03fbcb1cd 100644 --- a/include/dm/test.h +++ b/include/dm/test.h @@ -98,6 +98,26 @@ struct dm_test_parent_data { int flag; }; +/* Test values for test device's uclass platform data */ +enum { + TEST_UC_PDATA_INTVAL1 = 2, + TEST_UC_PDATA_INTVAL2 = 334, + TEST_UC_PDATA_INTVAL3 = 789452, +}; + +/** + * struct dm_test_uclass_platda - uclass's information on each device + * + * @intval1: set to TEST_UC_PDATA_INTVAL1 in .post_bind method of test uclass + * @intval2: set to TEST_UC_PDATA_INTVAL2 in .post_bind method of test uclass + * @intval3: set to TEST_UC_PDATA_INTVAL3 in .post_bind method of test uclass + */ +struct dm_test_perdev_uc_pdata { + int intval1; + int intval2; + int intval3; +}; + /* * Operation counts for the test driver, used to check that each method is * called correctly -- cgit