// SPDX-License-Identifier: GPL-2.0+ /* * Copyright (C) 2015 Google, Inc */ #include #include #include #include #include #include #include #include /* Base test of register maps */ static int dm_test_regmap_base(struct unit_test_state *uts) { struct udevice *dev; struct regmap *map; int i; ut_assertok(uclass_get_device(UCLASS_SYSCON, 0, &dev)); map = syscon_get_regmap(dev); ut_assertok_ptr(map); ut_asserteq(1, map->range_count); ut_asserteq(0x10, map->base); ut_asserteq(0x10, map->range->start); ut_asserteq(4, map->range->size); ut_asserteq_ptr(&map->base_range, map->range); ut_asserteq(0x10, map_to_sysmem(regmap_get_range(map, 0))); ut_assertok(uclass_get_device(UCLASS_SYSCON, 1, &dev)); map = syscon_get_regmap(dev); ut_assertok_ptr(map); ut_asserteq(4, map->range_count); ut_asserteq(0x20, map->base); ut_assert(&map->base_range != map->range); for (i = 0; i < 4; i++) { const unsigned long addr = 0x20 + 8 * i; ut_asserteq(addr, map->range[i].start); ut_asserteq(5 + i, map->range[i].size); ut_asserteq(addr, map_to_sysmem(regmap_get_range(map, i))); } /* Check that we can't pretend a different device is a syscon */ ut_assertok(uclass_get_device(UCLASS_I2C, 0, &dev)); map = syscon_get_regmap(dev); ut_asserteq_ptr(ERR_PTR(-ENOEXEC), map); return 0; } DM_TEST(dm_test_regmap_base, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); /* Test we can access a regmap through syscon */ static int dm_test_regmap_syscon(struct unit_test_state *uts) { struct regmap *map; map = syscon_get_regmap_by_driver_data(SYSCON0); ut_assertok_ptr(map); ut_asserteq(1, map->range_count); map = syscon_get_regmap_by_driver_data(SYSCON1); ut_assertok_ptr(map); ut_asserteq(4, map->range_count); map = syscon_get_regmap_by_driver_data(SYSCON_COUNT); ut_asserteq_ptr(ERR_PTR(-ENODEV), map); ut_asserteq(0x10, map_to_sysmem(syscon_get_first_range(SYSCON0))); ut_asserteq(0x20, map_to_sysmem(syscon_get_first_range(SYSCON1))); ut_asserteq_ptr(ERR_PTR(-ENODEV), syscon_get_first_range(SYSCON_COUNT)); return 0; } DM_TEST(dm_test_regmap_syscon, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);