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| author | York Sun <yorksun@freescale.com> | 2015-11-06 09:58:46 -0800 |
|---|---|---|
| committer | York Sun <yorksun@freescale.com> | 2015-11-30 09:11:12 -0800 |
| commit | da305b9f57cd459a26d276390f699666a5d8bc4f (patch) | |
| tree | 3d5977eb2fbf3d41d4e05cdc57b276f0b07de693 /arch/arm/lib | |
| parent | d764129d30768df72cd07844dd50d11e74b0de14 (diff) | |
drivers/ddr/fsl: Fix typo in BIST test for DDR4
BIST test code has a typo, resulting the binding registers not
maintained as expected. This typo results BIST runs twice on
the covered memory.
Signed-off-by: York Sun <yorksun@freescale.com>
Reported-by: Shengzhou Liu <Shengzhou.Liu@freescale.com>
Diffstat (limited to 'arch/arm/lib')
0 files changed, 0 insertions, 0 deletions