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authorRobert Beckett <bob.beckett@collabora.com>2019-10-28 17:44:58 +0000
committerHeiko Schocher <hs@denx.de>2019-12-17 06:57:22 +0100
commit22e93511be2e012d3f807641b07e09b649a71ef6 (patch)
treedf80b24f773abc32a670dc241c4d044d5c83ed6f /arch/mips/dts/comtrend,ar-5387un.dts
parent85968522b928e19a27aa79f0cb186c80b8b82e47 (diff)
dm: i2c: EEPROM simulator allow tests visibility of addr and offset
Improve i2c EEPROM simulator testing by providing access functions to check the previous chip addr and offset. Given that we can now directly test the offsets, also simplified the offset mapping and allow for wrapping acceses. Signed-off-by: Robert Beckett <bob.beckett@collabora.com> Reviewed-by: Heiko Schocher <hs@denx.de>
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