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authorBryan O'Donoghue <bryan.odonoghue@linaro.org>2018-03-26 15:27:33 +0100
committerStefano Babic <sbabic@denx.de>2018-04-15 11:44:13 +0200
commit1ab1ffded4f1363080324d96a12fd76c90175be2 (patch)
treed6d5c95609a53fe712a53b351a9d3c35402f3c13 /board
parentca83182226d2300722ebbb44e8f291678606b568 (diff)
imx: mx7: Add comment to describe OTP TESTER registers
The tester registers provide a unique chip-level identifier which get_board_serial() returns in a "struct tag_serialnr". This patch documents the properties of the registers; in summary. 31:0 OCOTP_TESTER0 (most significant) - FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID OCOTP_TESTER1 (least significant) 31:24 - The X-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique ID 23:16 - The Y-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique ID 15:11 - The wafer number of the wafer on which the device was fabricated/SJC CHALLENGE/ Unique ID 10:0 - FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID The 64 bits of data generate a unique serial number per-chip. Signed-off-by: Bryan O'Donoghue <bryan.odonoghue@linaro.org> Cc: Fabio Estevam <fabio.estevam@nxp.com> Cc: Peng Fan <peng.fan@nxp.com> Cc: Stefano Babic <sbabic@denx.de> Reviewed-by: Fabio Estevam <fabio.estevam@nxp.com>
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