diff options
Diffstat (limited to 'test')
| -rw-r--r-- | test/dm/sf.c | 46 |
1 files changed, 44 insertions, 2 deletions
diff --git a/test/dm/sf.c b/test/dm/sf.c index 35241b9f57..b23e7f8edd 100644 --- a/test/dm/sf.c +++ b/test/dm/sf.c @@ -6,6 +6,8 @@ #include <common.h> #include <dm.h> #include <fdtdec.h> +#include <mapmem.h> +#include <os.h> #include <spi.h> #include <spi_flash.h> #include <asm/state.h> @@ -13,9 +15,49 @@ #include <dm/util.h> #include <test/ut.h> -/* Test that sandbox SPI flash works correctly */ +/* Simple test of sandbox SPI flash */ static int dm_test_spi_flash(struct unit_test_state *uts) { + struct udevice *dev, *emul; + int full_size = 0x200000; + int size = 0x10000; + u8 *src, *dst; + int i; + + src = map_sysmem(0x20000, full_size); + ut_assertok(os_write_file("spi.bin", src, full_size)); + ut_assertok(uclass_first_device_err(UCLASS_SPI_FLASH, &dev)); + + dst = map_sysmem(0x20000 + full_size, full_size); + ut_assertok(spi_flash_read_dm(dev, 0, size, dst)); + ut_assertok(memcmp(src, dst, size)); + + /* Erase */ + ut_assertok(spi_flash_erase_dm(dev, 0, size)); + ut_assertok(spi_flash_read_dm(dev, 0, size, dst)); + for (i = 0; i < size; i++) + ut_asserteq(dst[i], 0xff); + + /* Write some new data */ + for (i = 0; i < size; i++) + src[i] = i; + ut_assertok(spi_flash_write_dm(dev, 0, size, src)); + ut_assertok(spi_flash_read_dm(dev, 0, size, dst)); + ut_assertok(memcmp(src, dst, size)); + + /* + * Since we are about to destroy all devices, we must tell sandbox + * to forget the emulation device + */ + sandbox_sf_unbind_emul(state_get_current(), 0, 0); + + return 0; +} +DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); + +/* Functional test that sandbox SPI flash works correctly */ +static int dm_test_spi_flash_func(struct unit_test_state *uts) +{ /* * Create an empty test file and run the SPI flash tests. This is a * long way from being a unit test, but it does test SPI device and @@ -39,4 +81,4 @@ static int dm_test_spi_flash(struct unit_test_state *uts) return 0; } -DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); +DM_TEST(dm_test_spi_flash_func, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); |