Age | Commit message (Expand) | Author |
---|---|---|
2020-05-19 | test: Use ut_asserteq_mem() where possible | Simon Glass |
2019-12-17 | dm: i2c: EEPROM simulator add tests for addr offset mask | Robert Beckett |
2019-12-17 | dm: i2c: EEPROM simulator allow tests visibility of addr and offset | Robert Beckett |
2018-11-29 | dm: sandbox: i2c: Use new emulator parent uclass | Simon Glass |
2018-05-07 | SPDX: Convert all of our single license tags to Linux Kernel style | Tom Rini |
2016-07-27 | dm: Use dm_scan_fdt_dev() directly where possible | Simon Glass |
2015-05-21 | test: Generalize the unit test framework | Joe Hershberger |
2015-05-05 | dm: i2c: Add an explicit test mode to the sandbox I2C driver | Simon Glass |
2015-02-12 | dm: i2c: Add a dm_ prefix to driver model bus speed functions | Simon Glass |
2015-01-29 | dm: i2c: Provide an offset length parameter where needed | Simon Glass |
2015-01-29 | dm: i2c: Rename driver model I2C functions to permit compatibility | Simon Glass |
2014-12-11 | dm: i2c: Add tests for I2C | Simon Glass |