Age | Commit message (Expand) | Author |
---|---|---|
2014-12-11 | dm: i2c: Add tests for I2C | Simon Glass |
2014-10-22 | dm: sf: Add tests for SPI flash | Simon Glass |
2014-07-23 | dm: Provide a function to scan child FDT nodes | Simon Glass |
2014-07-23 | dm: Introduce device sequence numbering | Simon Glass |
2014-07-23 | dm: Allow drivers to be marked 'before relocation' | Simon Glass |
2014-07-23 | dm: Use an explicit expect value in core tests | Simon Glass |
2014-03-04 | dm: Add basic tests | Simon Glass |