1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
170
171
172
173
174
175
176
177
178
179
180
181
182
183
184
185
186
187
188
189
190
191
192
193
194
195
196
197
|
// SPDX-License-Identifier: GPL-2.0+
/*
* Tests for the driver model ADC API
*
* Copyright (c) 2015 Samsung Electronics
* Przemyslaw Marczak <p.marczak@samsung.com>
*/
#include <common.h>
#include <adc.h>
#include <dm.h>
#include <dm/root.h>
#include <dm/util.h>
#include <dm/test.h>
#include <errno.h>
#include <fdtdec.h>
#include <power/regulator.h>
#include <power/sandbox_pmic.h>
#include <sandbox-adc.h>
#include <test/ut.h>
static int dm_test_adc_bind(struct unit_test_state *uts)
{
struct udevice *dev;
unsigned int channel_mask;
ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name);
ut_assertok(adc_channel_mask(dev, &channel_mask));
ut_asserteq((1 << SANDBOX_ADC_CHANNELS) - 1, channel_mask);
return 0;
}
DM_TEST(dm_test_adc_bind, DM_TESTF_SCAN_FDT);
static int dm_test_adc_wrong_channel_selection(struct unit_test_state *uts)
{
struct udevice *dev;
ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
ut_asserteq(-EINVAL, adc_start_channel(dev, SANDBOX_ADC_CHANNELS));
return 0;
}
DM_TEST(dm_test_adc_wrong_channel_selection, DM_TESTF_SCAN_FDT);
static int dm_test_adc_supply(struct unit_test_state *uts)
{
struct udevice *supply;
struct udevice *dev;
int uV;
ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
/* Test Vss value - predefined 0 uV */
ut_assertok(adc_vss_value(dev, &uV));
ut_asserteq(SANDBOX_ADC_VSS_VALUE, uV);
/* Test Vdd initial value - buck2 */
ut_assertok(adc_vdd_value(dev, &uV));
ut_asserteq(SANDBOX_BUCK2_INITIAL_EXPECTED_UV, uV);
/* Change Vdd value - buck2 manual preset */
ut_assertok(regulator_get_by_devname(SANDBOX_BUCK2_DEVNAME, &supply));
ut_assertok(regulator_set_value(supply, SANDBOX_BUCK2_SET_UV));
ut_asserteq(SANDBOX_BUCK2_SET_UV, regulator_get_value(supply));
/* Update ADC platdata and get new Vdd value */
ut_assertok(adc_vdd_value(dev, &uV));
ut_asserteq(SANDBOX_BUCK2_SET_UV, uV);
/* Disable buck2 and test ADC supply enable function */
ut_assertok(regulator_set_enable(supply, false));
ut_asserteq(false, regulator_get_enable(supply));
/* adc_start_channel() should enable the supply regulator */
ut_assertok(adc_start_channel(dev, 0));
ut_asserteq(true, regulator_get_enable(supply));
return 0;
}
DM_TEST(dm_test_adc_supply, DM_TESTF_SCAN_FDT);
struct adc_channel adc_channel_test_data[] = {
{ 0, SANDBOX_ADC_CHANNEL0_DATA },
{ 1, SANDBOX_ADC_CHANNEL1_DATA },
{ 2, SANDBOX_ADC_CHANNEL2_DATA },
{ 3, SANDBOX_ADC_CHANNEL3_DATA },
};
static int dm_test_adc_single_channel_conversion(struct unit_test_state *uts)
{
struct adc_channel *tdata = adc_channel_test_data;
unsigned int i, data;
struct udevice *dev;
ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
/* Test each ADC channel's value */
for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
ut_assertok(adc_start_channel(dev, tdata->id));
ut_assertok(adc_channel_data(dev, tdata->id, &data));
ut_asserteq(tdata->data, data);
}
return 0;
}
DM_TEST(dm_test_adc_single_channel_conversion, DM_TESTF_SCAN_FDT);
static int dm_test_adc_multi_channel_conversion(struct unit_test_state *uts)
{
struct adc_channel channels[SANDBOX_ADC_CHANNELS];
struct udevice *dev;
struct adc_channel *tdata = adc_channel_test_data;
unsigned int i, channel_mask;
channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
ADC_CHANNEL(2) | ADC_CHANNEL(3);
/* Start multi channel conversion */
ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
ut_assertok(adc_start_channels(dev, channel_mask));
ut_assertok(adc_channels_data(dev, channel_mask, channels));
/* Compare the expected and returned conversion data. */
for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
ut_asserteq(tdata->data, channels[i].data);
return 0;
}
DM_TEST(dm_test_adc_multi_channel_conversion, DM_TESTF_SCAN_FDT);
static int dm_test_adc_single_channel_shot(struct unit_test_state *uts)
{
struct adc_channel *tdata = adc_channel_test_data;
unsigned int i, data;
for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
/* Start single channel conversion */
ut_assertok(adc_channel_single_shot("adc@0", tdata->id, &data));
/* Compare the expected and returned conversion data. */
ut_asserteq(tdata->data, data);
}
return 0;
}
DM_TEST(dm_test_adc_single_channel_shot, DM_TESTF_SCAN_FDT);
static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts)
{
struct adc_channel channels[SANDBOX_ADC_CHANNELS];
struct adc_channel *tdata = adc_channel_test_data;
unsigned int i, channel_mask;
channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
ADC_CHANNEL(2) | ADC_CHANNEL(3);
/* Start single call and multi channel conversion */
ut_assertok(adc_channels_single_shot("adc@0", channel_mask, channels));
/* Compare the expected and returned conversion data. */
for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
ut_asserteq(tdata->data, channels[i].data);
return 0;
}
DM_TEST(dm_test_adc_multi_channel_shot, DM_TESTF_SCAN_FDT);
static const int dm_test_adc_uV_data[SANDBOX_ADC_CHANNELS] = {
((u64)SANDBOX_ADC_CHANNEL0_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
SANDBOX_ADC_DATA_MASK,
((u64)SANDBOX_ADC_CHANNEL1_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
SANDBOX_ADC_DATA_MASK,
((u64)SANDBOX_ADC_CHANNEL2_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
SANDBOX_ADC_DATA_MASK,
((u64)SANDBOX_ADC_CHANNEL3_DATA * SANDBOX_BUCK2_INITIAL_EXPECTED_UV) /
SANDBOX_ADC_DATA_MASK,
};
static int dm_test_adc_raw_to_uV(struct unit_test_state *uts)
{
struct adc_channel *tdata = adc_channel_test_data;
unsigned int i, data;
struct udevice *dev;
int uV;
ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc@0", &dev));
/* Test each ADC channel's value in microvolts */
for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
ut_assertok(adc_start_channel(dev, tdata->id));
ut_assertok(adc_channel_data(dev, tdata->id, &data));
ut_assertok(adc_raw_to_uV(dev, data, &uV));
ut_asserteq(dm_test_adc_uV_data[i], uV);
}
return 0;
}
DM_TEST(dm_test_adc_raw_to_uV, DM_TESTF_SCAN_FDT);
|
