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author | Bryan O'Donoghue <bryan.odonoghue@linaro.org> | 2018-03-26 15:27:33 +0100 |
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committer | Stefano Babic <sbabic@denx.de> | 2018-04-15 11:44:13 +0200 |
commit | 1ab1ffded4f1363080324d96a12fd76c90175be2 (patch) | |
tree | d6d5c95609a53fe712a53b351a9d3c35402f3c13 /board/warp7 | |
parent | ca83182226d2300722ebbb44e8f291678606b568 (diff) |
imx: mx7: Add comment to describe OTP TESTER registers
The tester registers provide a unique chip-level identifier which
get_board_serial() returns in a "struct tag_serialnr".
This patch documents the properties of the registers; in summary.
31:0 OCOTP_TESTER0 (most significant)
- FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID
OCOTP_TESTER1 (least significant)
31:24
- The X-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique
ID
23:16
- The Y-coordinate of the die location on the wafer/SJC CHALLENGE/ Unique
ID
15:11
- The wafer number of the wafer on which the device was fabricated/SJC
CHALLENGE/ Unique ID
10:0
- FSL-wide unique, encoded LOT ID STD II/SJC CHALLENGE/ Unique ID
The 64 bits of data generate a unique serial number per-chip.
Signed-off-by: Bryan O'Donoghue <bryan.odonoghue@linaro.org>
Cc: Fabio Estevam <fabio.estevam@nxp.com>
Cc: Peng Fan <peng.fan@nxp.com>
Cc: Stefano Babic <sbabic@denx.de>
Reviewed-by: Fabio Estevam <fabio.estevam@nxp.com>
Diffstat (limited to 'board/warp7')
0 files changed, 0 insertions, 0 deletions